HILLSBORO, Ore., July 24, 2012 (GLOBE NEWSWIRE) -- FEI (Nasdaq:FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, today announced the release of the new Titan™ ETEM G2―an environmental transmission electron microscope (ETEM) that enables time-resolved, in-situ studies of processes and materials exposed to reactive gases and elevated temperatures. Developers of energy and environmental products, such as catalysts, fuel cells and nanomaterials, can use the Titan ETEM G2 to study the relationships between structure and performance by observing atomic scale processes and gas-solid interactions under conditions that mimic the operational environment.
"FEI reset the bar for highest resolution with the introduction of the Titan TEM. We then revolutionized compositional analysis with 50 times increase in speed using our ChemiSTEM™ technology. With the introduction of the Titan ETEM G2, we will deliver a similar kind of game-changing impact by extending TEM analysis to dynamic processes and interactions," stated Trisha Rice, vice president and general manager of FEI's Materials Science Business Unit.
"The Titan ETEM G2 system's most immediate impact will be in helping researchers improve the performance of catalysts, such as those used to remove harmful components from automobile exhaust or to synthesize innovative nanomaterials," said Professor Seiji Takeda, Osaka University, Japan. "ETEM is unique in its ability to allow investigators to directly view changes in the atomic structure of individual nanoparticles as they interact with other atomic or molecular entities, or respond to changes in the temperature, pressure or composition of the gaseous environment."
Stig Helveg, senior research scientist of Haldor Topsoe, a catalyst company located in Lyngby, Denmark, stated, "ETEM's ability to image and characterize individual nanoparticles fully complements the spatially- averaging spectroscopy-based in situ techniques, widely used in our industry, as well as experimental and theoretical surface science tools. We expect the detailed understanding of structure-function relationships, enabled by ETEM, to provide critical support for the rational design of new catalysts with improved performance."
About the Titan ETEM G2
Like other members of the Titan family of TEMs, the Titan ETEM G2 can be fitted with an image Cs corrector and FEI's proprietary X-FEG and monochromator technology. New features include a redesigned user interface that provides fast switching between ETEM and high vacuum modes and full software control of all operational parameters. An innovative, differentially pumped objective lens, uniquely designed with a large polepiece gap, allows ample space for the gas inlet and full double tilt capability for 3D tomography. The gas inlet system allows operators to safely add inert or reactive gases to the chamber at preset pressures from 10-3 Pa up to 2000 Pa (N2).
For more information, please visit: www.fei.com/ETEM.
About FEI
FEI (Nasdaq:FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and solutions for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). Headquartered in Hillsboro, Ore., USA, FEI has over 2,200 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.
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FEI Safe Harbor Statement
This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Titan ETEM G2 system. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and challenges, changes to the technology, the inability of FEI, its suppliers or project partners to make the technological advances required for the technology to achieve anticipated results, the inability of customers to develop and deploy the expected new applications and our ability to manufacture, ship and deliver the tools or software as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.