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TOKYO, Aug. 01, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will showcase its latest memory devices and memory system-level solutions at...
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TOKYO, Dec. 07, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced three new additions to its suite of memory test products. The...
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TOKYO, July 26, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has installed its first enhanced T5851-STM16G tester capable of nonvolatile...
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SAN JOSE, Calif., July 25, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its latest storage and memory test solutions at Flash...
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TOKYO, Jan. 15, 2019 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its wide range of solutions for advanced IC testing and wafer...
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TOKYO, Nov. 27, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has unveiled its new T5851 STM16G memory tester for evaluating high-speed...
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New B6700L Tester Expands the Platform’s Temperature Range While B6700S System Offers Zero-Footprint Configuration TOKYO, Oct. 24, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...
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TOKYO, Oct. 10, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet...