Advantest to Showcase Latest Test Solutions at SEMICON Korea 2025, Feb. 19-21, in Seoul
February 13, 2025 03:05 ET
|
Advantest America, Inc.
TOKYO, Feb. 13, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will showcase its latest test solutions at SEMICON Korea 2025 on Feb. 19-21...
Advantest Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM Devices
February 12, 2025 03:05 ET
|
Advantest America, Inc.
TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge...
Advantest will Showcase Latest Memory Test Solutions at Future of Memory and Storage 2024
August 01, 2024 03:05 ET
|
Advantest America, Inc.
TOKYO, Aug. 01, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will showcase its latest memory devices and memory system-level solutions at...
Advantest to Feature Latest End-to-End Test Solutions for 5G, Automotive and IoT at Flash Memory Summit on August 6-8
July 30, 2019 03:05 ET
|
Advantest America, Inc.
TOKYO, July 30, 2019 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its latest storage and memory test solutions, including the...
Advantest to Feature Latest IC Test Solutions Enabling Implementation of 5G Technology at SEMICON West on July 9-11
July 01, 2019 03:05 ET
|
Advantest America, Inc.
TOKYO, July 01, 2019 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its latest IC test solutions, including the debut of its V93000...
Advantest Launches Newest Memory Burn-In Tester to Meet Growing Global Demand for NAND Flash and DRAM Devices
October 10, 2018 03:05 ET
|
Advantest America, Inc.
TOKYO, Oct. 10, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet...