FEI’s New Themis Z S/TEM Sets New Standards for High Performance Imaging and Analysis
July 14, 2016 08:15 ET
|
FEI Company
HILLSBORO, Ore., July 14, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today released its new Themis™ Z scanning/transmission electron microscope (S/TEM), once again raising the bar for imaging and...
Photo Release -- FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center
May 11, 2011 08:20 ET
|
FEI Company
HILLSBORO, Ore. and SAN SEBASTIAN, Spain, May 11, 2011 (GLOBE NEWSWIRE) -- FEI Company (Nasdaq:FEIC), a leading scientific instrumentation company, and the Basque Nanoscience Cooperative Research...