Microsemi Webinar: Single Event Upset (SEU) Immunity in Terrestrial FPGA Applications


MEDIA ADVISORY, Aug. 29, 2011 (GLOBE NEWSWIRE) --

TITLE:  Reliability is Vital—Learn about Single Event Upset (SEU) Immunity in Terrestrial FPGA Applications
   
WHO:
 
The webinar is designed for reliability engineers and FPGA designers focused on high-impact applications in medical, automotive, industrial, military and avionics segments.
   
WHAT:



Discussion regarding the use of SEU to combat integrated circuit malfunctions due to subatomic radiation particles in high-impact, terrestrial applications. This is an issue of increasing concern, particularly in applications where down-time is not an option, loss of communication is not acceptable, and loss of automation and control is not tolerated. Designers cannot afford to take risks with their FPGA devices. The webinar will be led by Minal Sawant, product marketer for medical, military and avionics in Microsemi's SoC product group. 
   
WHEN: Thursday, Sept. 8, 2011 from 9-10 a.m. PDT.
   
REGISTER:




To register and reserve a webinar seat, visit  https://www1.gotomeeting.com/register/223232624.  A recorded version of the webinar and all presentation materials will be available after the event. 

For more information on Microsemi's SEU solutions please visit www.microsemi.com/soc.

About Microsemi

Microsemi Corporation (Nasdaq:MSCC) offers a comprehensive portfolio of semiconductor solutions for: aerospace, defense and security; enterprise and communications; and industrial and alternative energy markets. Products include high-performance, high-reliability analog and RF devices, mixed-signal and RF integrated circuits, customizable SoCs, FPGAs, and complete subsystems. Microsemi is headquartered in Aliso Viejo, Calif., and has more than 2,700 employees globally.Learn more at www.microsemi.com.

The Microsemi Corporation logo is available at http://www.globenewswire.com/newsroom/prs/?pkgid=1233


            

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