Advantest Introduces Two New Systems in its B6700 Series of Memory Burn-In Testers for Next-Generation NAND Flash Memories
24 oct. 2018 03h05 HE
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Advantest America, Inc.
New B6700L Tester Expands the Platform’s Temperature Range While B6700S System Offers Zero-Footprint Configuration TOKYO, Oct. 24, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...
Advantest Launches Newest Memory Burn-In Tester to Meet Growing Global Demand for NAND Flash and DRAM Devices
10 oct. 2018 03h05 HE
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Advantest America, Inc.
TOKYO, Oct. 10, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet...