Advantest will Showcase Latest Memory Test Solutions at Future of Memory and Storage 2024
01 août 2024 03h05 HE
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Advantest America, Inc.
TOKYO, Aug. 01, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will showcase its latest memory devices and memory system-level solutions at...
Advantest Targets NAND Flash/NVM Market with New Group of Memory Test Products
07 déc. 2023 03h05 HE
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Advantest America, Inc.
TOKYO, Dec. 07, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced three new additions to its suite of memory test products. The...
Advantest Adds System-Level Testing Capability for Advanced Memory ICs Used in High-Growth Automotive Market
26 juil. 2022 03h05 HE
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Advantest America, Inc.
TOKYO, July 26, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has installed its first enhanced T5851-STM16G tester capable of nonvolatile...
Advantest to Feature Latest PCIe Gen. 5 CXL and NVMe Testing Solutions at Flash Memory Summit 2022
25 juil. 2022 03h05 HE
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Advantest America, Inc.
SAN JOSE, Calif., July 25, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its latest storage and memory test solutions at Flash...
Advantest to Showcase Latest Semiconductor Test Solutions Enabling 5G Connectivity at SEMICON Korea on January 23-25
15 janv. 2019 03h05 HE
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Advantest America, Inc.
TOKYO, Jan. 15, 2019 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its wide range of solutions for advanced IC testing and wafer...
Advantest Introduces New Solution for System-Level Testing of Advanced, High-Speed Semiconductor Memories for Mobile Applications
27 nov. 2018 03h05 HE
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Advantest America, Inc.
TOKYO, Nov. 27, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has unveiled its new T5851 STM16G memory tester for evaluating high-speed...
Advantest Introduces Two New Systems in its B6700 Series of Memory Burn-In Testers for Next-Generation NAND Flash Memories
24 oct. 2018 03h05 HE
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Advantest America, Inc.
New B6700L Tester Expands the Platform’s Temperature Range While B6700S System Offers Zero-Footprint Configuration TOKYO, Oct. 24, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...
Advantest Launches Newest Memory Burn-In Tester to Meet Growing Global Demand for NAND Flash and DRAM Devices
10 oct. 2018 03h05 HE
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Advantest America, Inc.
TOKYO, Oct. 10, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet...