-- Choose between flat or fully organized electrically correct schematics. If a comprehensive report is required, the fully organized schematics are preferred. If a Design Team needs analysis sooner rather than later, and is willing to do some schematic organization themselves, the flat schematics are preferred. -- Instantly cross-reference between the schematics and a massive image mosaic, comprised of tens of thousands of Scanning Electron Microscope images across all the layers of a device. -- Automatically define block designs and locate similar instances within the device -- A feature commonly used to accelerate device analysis or find instances of patent infringement. -- Export into a variety of netlist formats for further analysis and simulation.Chipworks will be demonstrating ICWorks at the Design Automation Conference (DAC) using real examples from a Texas Instruments RF Transceiver and an SRAM Macro from Intel's 45nm Atom Microprocessor. The demonstration will take place at the DAC Conference on Tuesday, July 28 at 11:00 a.m. in the IC Design Central Partner Pavilion or in Booth 4203 throughout the conference. About Chipworks Chipworks is the recognized leader in reverse engineering and patent infringement analysis of semiconductors and electronic systems. The company's ability to analyze the circuitry and physical composition of these systems makes them a key partner in the success of the world's largest semiconductor and microelectronics companies. Intellectual property groups and their legal counsel trust Chipworks for success in patent licensing and litigation -- earning hundreds of millions of dollars in patent licenses and saving as much in royalty payments. Research & Development and Product Management rely on Chipworks for success in new product design and launch, saving hundreds of millions of dollars in design and earning even more through superior product design and faster launches. Headquartered in Canada, Chipworks maintains offices in the USA, Japan, Korea, and Taiwan. EDITORS: Photos available
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