Contact Information: Sela Company Contact: Carmen Lee Sela USA 408.235.8500 Agency Contact: Bruce Kirkpatrick Kirkpatrick Communications, Inc. 925.244.9100
Major Japanese Semiconductor Device Manufacturer Purchases Sela's New Xact TEM/STEM Sample Preparation System
Semiconductor Device Manufacturer Adopts Sela Xact Tool for Enhancing Critical Failure Analysis and Advanced Process Monitoring
| Source: Sela
YOKNEAM, ISRAEL--(Marketwire - November 4, 2009) - A major Japanese semiconductor device
manufacturer has purchased and qualified Sela's new Xact sample preparation
system. The system has been fully operational and qualified since Q2 2009,
with high reliability.
The Xact system is the first TEM/STEM sample preparation system using
Adaptive Ion Milling (AIM) technology. Exceeding traditional ion beam
technologies, Sela's new AIM technology can reduce sample thickness
routinely to 30 nanometers and thinner over a large area with high
precision, artifact-free quality at higher throughput with precise
end-point detection.
The customer reports the Xact system proved multiple advantages for TEM
imaging including highest quality samples, automated operation, high
throughput, ease of use, and was quick to install and qualify. These
capabilities reduce TEM lab turnaround time and enhance productivity.
Commented Colin Smith, Sela CEO, "Xact is an ideal tool for dedicated
TEM/STEM specimen preparation. There is an expanding need to improve the
quality and robustness of TEM sample preparation. Xact specifically
addresses limitations of FIB and other technologies. We are pleased this
major Japanese device maker thoroughly evaluated and endorses Xact as tool
of choice for TEM sample preparation."
About Sela: Sela, Ltd. is a leading supplier of automated SEM and TEM
sample preparation equipment for the semiconductor industry. Sela's new
Xact system incorporates proprietary Adaptive Ion Milling to create leading
edge quality samples for TEM that meet needs for industry technology
roadmap for multiple generations. Sela's proprietary Microcleaving
technology for SEM is unique in its ability to create precision
cross-sections without water, chemical or mechanical contact, and to enable
analysis of mirror images of a targeted feature. Camtek Ltd of Migdal
Haemek, Israel, announced its acquisition of Sela, Ltd. on September 24,
2009. For more information, go to www.sela.com and www.camtek.com