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November 27, 2012 03:05 ET | Source: Advantest

Advantest Introduces T2000 8Gbps Digital Module for High-Speed Testing of SoCs With Serial, Parallel or Memory Interfaces

TOKYO--(Marketwire - Nov 27, 2012) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has introduced its new T2000 8GDM to address the test requirements of...
November 07, 2012 03:05 ET | Source: Advantest

Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs

TOKYO--(Marketwire - Nov 7, 2012) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has introduced its new T2000 Integrated Massive Parallel test...
August 30, 2012 16:05 ET | Source: Advantest

Semiconductor Test Equipment Leader Advantest Completes Move of U.S. Headquarters to San Jose, Calif.

SAN JOSE, CA--(Marketwire - Aug 30, 2012) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has consolidated its Silicon Valley operations into a...
July 27, 2012 04:05 ET | Source: Advantest

Advantest Ships 500th V93000 Port Scale RF Tester to Chinese Producer of Wireless Communication ICs

SANTA CLARA, CA--(Marketwire - Jul 27, 2012) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has installed its 500th V93000 Port Scale RF test system,...
July 26, 2012 16:05 ET | Source: Advantest

Advantest Wins Best Supplier Award From STATS ChipPAC

TOKYO--(Marketwire - Jul 26, 2012) - Semiconductor test equipment leader Advantest Corporation (TSE: 6857) (NYSE: ATE) has received a Best Supplier Award from Singapore-based STATS ChipPAC...
July 09, 2012 23:00 ET | Source: Advantest

Advantest to Showcase Comprehensive Line-up of SOC and Memory Platforms at SEMICON West 2012

SANTA CLARA, CA--(Marketwire - Jul 9, 2012) - Global semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) will showcase its full suite of test solutions at the...
July 05, 2012 16:05 ET | Source: Advantest

Advantest Introduces Industry's Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs

TOKYO--(Marketwire - Jul 5, 2012) - Advantest Corporation (TSE: 6857) (NYSE: ATE) today announced the new T2000 LJC16 16-channel, low-jitter-clock module. The LJC16 module, which combines different...
June 19, 2012 16:05 ET | Source: Advantest

Hua Hong NEC and Advantest Co-Develop Wafer-Level High Parallelism Multi-Site Test Solution for RFID Devices

SHANGHAI, CHINA and TOKYO--(Marketwire - Jun 19, 2012) - Shanghai Hua Hong NEC Electronics Company, Ltd. ("Hua Hong NEC"), one of the leading pure-play foundries in the world, and Advantest...
May 30, 2012 16:05 ET | Source: Advantest Corporation

Advantest Ships 100th V93000 Smart Scale Test System in Product Line's First 10 Months

CUPERTINO, CA--(Marketwire - May 30, 2012) - Just ten months after launching its Smart Scale generation of testers, leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857)...
May 10, 2012 16:05 ET | Source: Advantest

Advantest's VOICE 2012 Semiconductor Test Conference Attracts Over 300 Attendees From Around the World

CUPERTINO, CA--(Marketwire - May 10, 2012) - The 2012 edition of the VOICE annual Users Group Conference organized by premier semiconductor test company Advantest (NYSE: ATE) and a committee of...