Latest News and Press Releases
Want to stay updated on the latest news?
-
TOKYO, JAPAN--(Marketwired - Feb 1, 2017) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will exhibit a wide array of test solutions at this year's SEMICON Korea...
-
TOKYO, JAPAN--(Marketwired - Jan 10, 2017) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has opened registration to attend its VOICE 2017 Developer Conference...
-
TOKYO, JAPAN--(Marketwired - Dec 7, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will exhibit the industry's widest range of test solutions for diverse...
-
TOKYO, JAPAN--(Marketwired - Dec 5, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced its M4872 pick-and-place handler to improve productivity...
-
TOKYO, JAPAN--(Marketwired - Nov 1, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has begun taking orders for its new T2000 AiR system, a compact,...
-
TOKYO, JAPAN--(Marketwired - Oct 19, 2016) - An international call for papers on semiconductor test solutions, best practices and innovative technologies has been issued for next year's annual...
-
MUNICH, GERMANY--(Marketwired - Sep 15, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its F7000 EB (electron beam) lithography system in...
-
TOKYO, JAPAN--(Marketwired - Sep 7, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) earned a Best of Show Award with its T5851 tester at the 11th Annual...
-
SAN JOSE, CA--(Marketwired - Aug 9, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will showcase two multi-protocol systems for testing advanced storage...
-
TOKYO, JAPAN--(Marketwired - Aug 8, 2016) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced the MPT3000HVM system, providing a single platform to test...